Yield Stability and Adaptability of 25 Grain Sorghum B-Lines across Six Environments in Egypt Using AMMI and GGE-Biplot Models | Chapter 05 | Advances in Agriculture and Fisheries Research Vol. 1

Presence of G×E interaction reduces the correlation between genotypic and phenotypic parameters and complicates progress of selection. Among several methods proposed for evaluation of the GE interaction, the AMMI and GGE-biplot are the most informative models. The objective of this study was to estimate the G×E interaction in sorghum parental lines and to identify sorghum B-lines of stability and adaptability across different environments using the AMMI and GGE-biplot models. Six environments with 25 sorghum B-lines were conducted at two locations in Egypt (Giza and Shandaweel) in two years and two planting dates in one location (Giza). A randomized complete block design was used in each environment (yield trial) with three replications. The AMMI analysis of variance indicated that the genotype (G), environment (E) and GE interaction had significant influence (p≤0.01) on sorghum grain yield. Based on AMMI model, BTX TSC-20 followed by ICSB-1808 showed both high yielding and stability across the test environments. However, ICSB-8001 (G11) and BTX-407 (G21), showed maximum stability, but with moderate grain yield. Based on GGE-biplot method, BTX TSC-20 (G25) was the winning genotype for the mega-environment which consists of E1 and E3, ICSB-14 (G3) for the mega-environment (E2 and E4), while BTX 2-1 (G20) for E5 mega-environment, ICSB-88003 (G12) and ICSB-70 (G6) for the mega-environment E6. These genotypes are the most adapted to the respective environments.

Author(s) Details

Dr. Ahmed Medhat Mohamed Al-Naggar
Department of Agronomy, Faculty of Agriculture, Cairo University, Egypt.

Rabie Mohamed Abd El-Salam
Department of Agronomy, Faculty of Agriculture, Cairo University, Egypt.

Walaa Yaseen Saad Yaseen
Agricultural Research Centre (ARC), Department of Grain Sorghum Research, Field Crops Research Institute, Giza, Egypt.

View Volume: http://bp.bookpi.org/index.php/bpi/catalog/book/138